Tip-induced surface polarization : a new mechanism for contrast in the scanning tunnelling microscopeNESS, H; FISHER, A. J; BRIGGS, G. A. D et al.Surface science. 1997, Vol 380, Num 1, pp L479-L484, issn 0039-6028Article

The thermal expansion as a possible mechanism of nanofabricationBASKIN, L. M; DROZDOV, A. V; VLADIMIROV, G. G et al.Surface science. 1996, Vol 369, Num 1-3, pp 385-392, issn 0039-6028Article

Nanoscale modification of conducting lines with a scanning force microscopeRANK, R; BRÜCKL, H; KRETZ, J et al.Vacuum. 1997, Vol 48, Num 5, pp 467-472, issn 0042-207XArticle

STM-induced annealing and nanoextrusion in nm-period multilayersGORBUNOV, A. A; RICHTER, J; POMPE, W et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 596-605, issn 0142-2421Conference Paper

Step roughness on Ag(111) investigated by STM : a systematic study of tip influenceMUGELE, F; RETTENBERGER, A; BONEBERG, J et al.Surface science. 1997, Vol 377-79, pp 62-65, issn 0039-6028Conference Paper

How does a tip tap ?BURNHAM, N. A; BEHREND, O. P; OULEVEY, F et al.Nanotechnology (Bristol. Print). 1997, Vol 8, Num 2, pp 67-75, issn 0957-4484Article

Mechanical properties studied at the nanoscale using Scanning Local-Acceleration Microscopy (SLAM)OULEVEY, F; BURNHAM, N. A; KULIK, A. J et al.Journal de physique. IV. 1996, Vol 6, Num 8, pp C8.731-C8.734, issn 1155-4339Conference Paper

Electron-beam-induced deposition of carbonaceous microstructures using scanning electron microscopyMIURA, N; ISHII, H; SHIRAKASHI, J.-I et al.Applied surface science. 1997, Vol 113114, pp 269-273, issn 0169-4332Conference Paper

Direct mechanical measurement of interatomic potentialsJARVIS, S. P; YAMADA, H; YAMAMOTO, S.-I et al.Nature (London). 1996, Vol 384, Num 6606, pp 247-249, issn 0028-0836Article

Tapping-mode scanning force microscopy : Metallic tips and samplesSARID, D.Computational materials science. 1996, Vol 5, Num 4, pp 291-297, issn 0927-0256Article

Constraining new forces in the casimir regime using the isoelectronic techniqueDECCA, R. S; LOPEZ, D; CHAN, H. B et al.Physical review letters. 2005, Vol 94, Num 24, pp 240401.1-240401.4, issn 0031-9007Article

Imaging magnetic charges with magnetic force microscopyHUBERT, A; RAVE, W; TOMLINSON, S. L et al.Physica status solidi. B. Basic research. 1997, Vol 204, Num 2, pp 817-828, issn 0370-1972Article

Conductance through a C₆₀ moleculePAULSSON, M; STAFSTRÖM, S.Synthetic metals. 1999, Vol 101, Num 1-3, pp 469-470, issn 0379-6779Conference Paper

Controlling the dynamics of a single atom in lateral atom manipulationSTROSCIO, Joseph A; CELOTTA, Robert J.Science (Washington, D.C.). 2004, Vol 306, Num 5694, pp 242-247, issn 0036-8075, 6 p.Article

Energy dissipation rate of a sample-induced thermal fluctuating field in the tip of a probe microscopeDOROFEYEV, I. A.Journal of physics. D, Applied physics (Print). 1998, Vol 31, Num 6, pp 600-601, issn 0022-3727Article

New AFM imaging for observing a high aspect structureHOSAKA, Sumio; MORIMOTO, Takafumi; KURODA, Hiroshi et al.Applied surface science. 2002, Vol 188, Num 3-4, pp 467-473, issn 0169-4332Conference Paper

Imaging using tip-surface distance variations vs. voltage in scanning tunneling microscopySEINE, G; CORATGER, R; CARLADOUS, A et al.Surface science. 2000, Vol 465, Num 3, pp 219-226, issn 0039-6028Article

AC thermal microscopy: a probe-sample thermal coupling modelDEPASSE, F; GOMES, S; TRANNOY, N et al.Journal of physics. D, Applied physics (Print). 1997, Vol 30, Num 24, pp 3279-3285, issn 0022-3727Article

Hamaker theory for atom-tip interactions of non-reactive surface in non-contact AFMXIE, H.-Y; SUN, X; NING, G.-L et al.Applied surface science. 2005, Vol 239, Num 2, pp 129-131, issn 0169-4332, 3 p.Article

Sensing molecular density of monolayers from fluoroalkyltrichlorosilane using atomic force microscope having a tip modified with fluoroalkyltrichlorosilane moleculesNAKAGAWA, T.Japanese journal of applied physics. 1997, Vol 36, Num 2A, pp L162-L165, issn 0021-4922, 2Article

Microscopie et spectroscopie locale dans le domaine infrarouge: étude et mise au point d'un microscope optique en champ proche = Microscopy and local spectroscopy in the infrared frange: study and development of a near field optical microscopePiednoir, Agnès; Creuzet, F.1994, 180 p.Thesis

Moving a silver atom on a Si(001) surface with a tip?PIZZAGALLI, L; OKON, J. C; JOACHIM, C et al.Surface science. 1997, Vol 384, Num 1-3, pp L852-L857, issn 0039-6028Article

On near-field scanning optical microscopy homogeneous and evanescent radiationXIAO, M.Journal of modern optics (Print). 1997, Vol 44, Num 2, pp 327-344, issn 0950-0340Article

Unique edge structure and stability of fabricated dimer islands on Si(001)LIU, F; SALLING, C. T; LAGALLY, M. G et al.Surface science. 1997, Vol 370, Num 2-3, pp L213-L218, issn 0039-6028Article

Ultrafast voltage-contrast scanning probe microscopy : Ordered molecular and nanoscale electronicsHO, F; HOU, A. S; NECHAY, B. A et al.Nanotechnology (Bristol. Print). 1996, Vol 7, Num 4, pp 385-389, issn 0957-4484Article